The optical spectra properties and short wavelength optical storage properties of Ag 5In 5Te 47 Sb 33 films are reported. The films are prepared by RF magnetron sputtering technology. The reflection of the crystalline film is 50% at 780 nm, and the difference of the reflection and reflectivity index is very large in the range of 600 nm to 900 nm, which shows the profitable characteristics as the recording layer for high reflection CD E system. The film also shows good recording properties at short wavelength (514.5 nm). A high reflectivity, larger than 15%, can be obtained with low power (11.5 mW) and short width (300 ns) laser beam.