Laser & Optoelectronics Progress, Volume. 52, Issue 9, 93002(2015)
Study on the Absorption Spectrum of Cu Thin films
Copper thin films are deposited on K9 optical glass substrate by magnetron sputtering method. By X-ray diffraction, the structure of copper film are detected. By Ultraviolet (UV)-visible spectrophotometer and grating spectrometer, the optical absorption properties of copper film are detected. The results show that: for the same Cu thin films, the peak-number and peak position obtained by two different instrument are different. The peak of absorption spectrum is two obtained by grating spectrometer and has a "red shift" to that obtained by UV-visible spectrophotometer, this due to the different instrument resolutions and different light sources.
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Fan Zhiqin, He Yuanyuan, Li Rui. Study on the Absorption Spectrum of Cu Thin films[J]. Laser & Optoelectronics Progress, 2015, 52(9): 93002
Category: Spectroscopy
Received: Feb. 2, 2015
Accepted: --
Published Online: Aug. 28, 2015
The Author Email: Zhiqin Fan (fanzhipin69@126.com)