Chinese Optics Letters, Volume. 2, Issue 3, 03179(2004)

Optical properties of ZnO thin films on SiO2 substrates deposited by radio frequency magnetron sputtering

Deping Xiong*, Xiqing Zhang, Jing Wang, Peng Lin, and Shihua Huang
Author Affiliations
  • Institute of Optoelectronic Technology, Key Laboratory for Information Storage, Displays and Materials, Beijing Jiaotong University, Beijing 100044
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    The optical properties of both the annealed and as-deposited ZnO thin films by radio frequency (RF) magnetron sputtering on SiO2 substrates were studied. In the annealed films, two pronounced well defined exciton absorption peaks for the A and B excitons were obtained in the absorption spectra, a strong free exciton emission without deep-level emissions was observed in the photoluminescence (PL) spectra at room temperature. It was found that annealing the films in oxygen dramatically improved the optical properties and the quality of the films.

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    Deping Xiong, Xiqing Zhang, Jing Wang, Peng Lin, Shihua Huang. Optical properties of ZnO thin films on SiO2 substrates deposited by radio frequency magnetron sputtering[J]. Chinese Optics Letters, 2004, 2(3): 03179

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    Paper Information

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    Received: Oct. 20, 2003

    Accepted: --

    Published Online: Jun. 6, 2006

    The Author Email: Deping Xiong (deping_x@sohu.com)

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