Acta Optica Sinica, Volume. 10, Issue 2, 161(1990)
Electronic speckle-pattern interferometry with polarization phase-shifting technique and it's application to deformation measurements
An E. S. P. I. with polarization phase-shifting technique for the deformation measorements of diffused surface is presented. The high stability is obtained by adopting the common-path optical phase-shifting technique. A phase map can be precisely obtained from computer image processing technique. The precise data of surface deformation are extracted directly by unwrapping technique.
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[in Chinese], [in Chinese]. Electronic speckle-pattern interferometry with polarization phase-shifting technique and it's application to deformation measurements[J]. Acta Optica Sinica, 1990, 10(2): 161