Acta Optica Sinica, Volume. 10, Issue 2, 161(1990)

Electronic speckle-pattern interferometry with polarization phase-shifting technique and it's application to deformation measurements

[in Chinese]1 and [in Chinese]2
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  • 1[in Chinese]
  • 2[in Chinese]
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    An E. S. P. I. with polarization phase-shifting technique for the deformation measorements of diffused surface is presented. The high stability is obtained by adopting the common-path optical phase-shifting technique. A phase map can be precisely obtained from computer image processing technique. The precise data of surface deformation are extracted directly by unwrapping technique.

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    [in Chinese], [in Chinese]. Electronic speckle-pattern interferometry with polarization phase-shifting technique and it's application to deformation measurements[J]. Acta Optica Sinica, 1990, 10(2): 161

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    Paper Information

    Category: Rapid communications

    Received: Mar. 7, 1989

    Accepted: --

    Published Online: Nov. 12, 2007

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