Chinese Journal of Lasers, Volume. 12, Issue 12, 722(1985)

Recrystallization of polysilicon films by Ar+ laser irradiation

Lin Chenglu, Shen Zongyong, Fang Fang, Lin Zixin, and Zon Shichang
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    CW Ar+ laser is used for recrystallization of polysilicon films on isolating layers. Experimental results show a large increase in grain size, significant improvement in electrical properties and compatibility with conventional integrated circuit technology.

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    Lin Chenglu, Shen Zongyong, Fang Fang, Lin Zixin, Zon Shichang. Recrystallization of polysilicon films by Ar+ laser irradiation[J]. Chinese Journal of Lasers, 1985, 12(12): 722

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    Paper Information

    Category: laser devices and laser physics

    Received: Nov. 17, 1984

    Accepted: --

    Published Online: Nov. 6, 2012

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