Electro-Optic Technology Application, Volume. 35, Issue 2, 70(2020)
Preparation of Short Wave Pass Filter by Multi Angle Spectrum Measurement
The reason for the deviation of the spectrum curve between the theoretical design and the actualpreparation of the short wave pass filter and the correction method are discussed in detail. At first, the high and lowrefractive index materials are selected to design the short wave pass filter system. And then, the actual film systemis prepared. Due to the control error of the coating machine, the actual film preparation thickness deviating from thetheoretical thickness, the actual preparation spectral curve out of tolerance is produced. By using multi angle spec.trum measurement method to measure the preparation results, according to the curve deviation from multi measure.ment results, the film material resulting film thickness deviation, the deviation size and direction are determined.After correcting the film thickness deviation, the short wave pass filter with flat spectral curve is prepared. And theshort wave pass filter film with better spectral performances can avoid the chromatic aberration effect of optical sys.tems.
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ZHANG Jin-bao, SHI Cheng-bo, GENG Hao. Preparation of Short Wave Pass Filter by Multi Angle Spectrum Measurement[J]. Electro-Optic Technology Application, 2020, 35(2): 70
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Received: Jan. 3, 2020
Accepted: --
Published Online: May. 28, 2020
The Author Email: Jin-bao ZHANG (491509637@qq.com)
CSTR:32186.14.