Acta Optica Sinica, Volume. 31, Issue 4, 418001(2011)
Simulation of Coherent Diffraction Imaging Based on Scanning Transimission X-Ray Microscopy of Shanghai Synchrotron Radiation Facility
Scanning transmission X-ray microscopy (STXM) is a recently developed spectroscopic microscopy based on the third generation synchrotron radiation facilities. Shanghai Synchrotron Radiation Facility (SSRF) has achieved STXM method, and the energy spans from 250 to 2000eV which covers most of the important elements′ absorption edge. A new experimental method: by fully using the STXM equipment to develop scanning X-ray diffractive technology, not only can improve the spatial resolution, but also can be easy to implement. Considering the specialty of SSRF, the condition of coherence of SSRF for scanning X-ray diffractive technology and experimental condition for the image resolution of reconstruction are discussed. Finally, the method using specific parameters is simulated. Simulation shows that using this technology can efficiently improve the spatial resolution based on specific experimental conditions of specific specimen.
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Tan Xingxing, Liu Haigang, Guo Zhi, Wu Yanqing, Xu Zijian, Wang Yong, Tai Renzhong. Simulation of Coherent Diffraction Imaging Based on Scanning Transimission X-Ray Microscopy of Shanghai Synchrotron Radiation Facility[J]. Acta Optica Sinica, 2011, 31(4): 418001
Category: Microscopy
Received: Sep. 21, 2010
Accepted: --
Published Online: Mar. 31, 2011
The Author Email: Xingxing Tan (tanxingxing@sinap.an.cn)