New method for 3D measurement based on image sequence

Opto-Electronic Engineering, Volume. 32, Issue 7, 59(2005)

[in Chinese]^1,2, [in Chinese]¹, and [in Chinese]¹

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¹[in Chinese]

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[in Chinese], [in Chinese], [in Chinese]. New method for 3D measurement based on image sequence[J]. Opto-Electronic Engineering, 2005, 32(7): 59

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Received: Nov. 1, 2004

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Published Online: Nov. 14, 2007

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