Chinese Journal of Lasers, Volume. 40, Issue 8, 815001(2013)
Quantitative Analysis of Fenitrothion Based on Surface-Enhanced Raman Spectroscopy
Principal component analysis (PCA), partial least squares (PLS) regression and surface-enhanced Raman spectroscopy (SERS) are used in quantitative analysis of the concentration of fenitrothion solution. 600~1800 cm-1 SERS spectra of the fenitrothion solution are measured. The spectra around characteristic peaks are preprocessed by the absolute value of the first derivative, the multiplicative scatter correction (MSC) and the standard normal transformation respectively. Models are built by PCA and PLS regression. Grouping alternating method is used to validate the performance of models. It is found that the model built with the MSC preprocessed spectra performs better. The accuracy of analysis meets the detecting requirement of fenitrothion.
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Weng Shizhuang, Zheng Shouguo, Li Pan, Chen Sheng, Zeng Xinhua, Li Miao, Zheng Xiaoju. Quantitative Analysis of Fenitrothion Based on Surface-Enhanced Raman Spectroscopy[J]. Chinese Journal of Lasers, 2013, 40(8): 815001
Category: Spectroscopy
Received: Feb. 23, 2013
Accepted: --
Published Online: Jul. 26, 2013
The Author Email: Shizhuang Weng (weng1989@mail.ustc.edu.cn)