Infrared Technology, Volume. 45, Issue 12, 1358(2023)
Nonlinear Data Fitting for Reflective Continuous Heat Excited Thermography Testing
To quantitatively detect defects using reflective continuous-heat-excited thermography, a heat conduction model of an object under continuous heat excitation was established, and the temperature increment-time relationship on the thermal excitation surface of the object was derived. Based on an analysis of the temperature increment-time relationship on the thermal excitation surface, the depth of the defects could be measured by nonlinear fitting of the temperature increment-time data. To test the feasibility of this method, a GFRP flat-bottomed hole specimen was fabricated and analyzed using reflective continuous-heat-excited thermography. The results show that this method is highly accurate in measuring the depth of defects.
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JIN Xueyuan, CHEN Jinliang. Nonlinear Data Fitting for Reflective Continuous Heat Excited Thermography Testing[J]. Infrared Technology, 2023, 45(12): 1358
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Received: Jan. 18, 2023
Accepted: --
Published Online: Jan. 17, 2024
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CSTR:32186.14.