Laser & Optoelectronics Progress, Volume. 49, Issue 2, 22301(2012)

Fabrication and Characterization of High-Speed and High-Efficiency Photodetector

Liu Shaoqing*, Han Qin, Yang Xiaohong, Liu Yu, Wang Jie, and Wang Xiuping
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    In this paper, we demonstrate a top-illuminated InGaAs pin photodetector grown on InP substrate. The fabrication, measurement and characterization of this photodetector are discussed in this paper. Low dark current densities of 1.37×10-5 A/cm2 at 0 and 93×10-5 A/cm2 at a reverse bias of 5 V are achieved. At a wavelength of 1.55 μm, the photodetectors have a responsivity of 0.61 A/W without antireflection coating, a linear photoresponse up to 28 mW optical power and a maximum linear photocurrent of 17 mA at -3 V. The measured 3 dB bandwidth of a 22 μm-diameter photodetector is 17.5 GHz.

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    Liu Shaoqing, Han Qin, Yang Xiaohong, Liu Yu, Wang Jie, Wang Xiuping. Fabrication and Characterization of High-Speed and High-Efficiency Photodetector[J]. Laser & Optoelectronics Progress, 2012, 49(2): 22301

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    Paper Information

    Category: Optical Devices

    Received: Aug. 22, 2011

    Accepted: --

    Published Online: Nov. 28, 2011

    The Author Email: Shaoqing Liu (sqliu@semi.ac.cn)

    DOI:10.3788/lop49.022301

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