Laser & Optoelectronics Progress, Volume. 60, Issue 7, 0712002(2023)

High Reflectivity Measurement Based on the Intracavity Loss Scanning of Ring-Down Cavity

Zhongzhou Tian1,2,3, Xing He1,2,3、*, Shuai Wang1,2,3, Ping Yang1,2,3, and Bing Xu1,2,3、**
Author Affiliations
  • 1Key Laboratory on Adaptive Optics, Chinese Academy of Sciences, Chengdu 610209, Sichuan, China
  • 2Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, Sichuan, China
  • 3University of Chinese Academy of Sciences, Beijing 100049, China
  • show less

    Aiming at the problem that the mapping relation between cavity misalignment parameters and cavity loss is unclear, and the relative cavity offset is not clear during the cavity tuning process, this study proposes a cavity loss optimization method based on cavity misalignment parameter scanning. In this method, the scanning optimization of the tilt adjustment of the cavity mirror was carried out. Similarly, the optimized cavity state of the relative misalignment between the initial cavity and test cavity was determined based on the ring-down time of the optical cavity. The experimental results reveal that there is an improvement in the measurement repeatability accuracy of the six experimental measurement results of the same high reflectivity sample, from 1.26×10-4 to 9.83×10-6. Furthermore, the measurement repeatability peak-to-valley value increases from 3.25×10-4 to 2.7×10-5 compared with the traditional method. Thus, the results verify that the proposed method can obtain a cavity tuning state with less relative cavity misalignment, which improves the optical cavity ring-down measurement system with low-initial cavity reflectivity.

    Tools

    Get Citation

    Copy Citation Text

    Zhongzhou Tian, Xing He, Shuai Wang, Ping Yang, Bing Xu. High Reflectivity Measurement Based on the Intracavity Loss Scanning of Ring-Down Cavity[J]. Laser & Optoelectronics Progress, 2023, 60(7): 0712002

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Dec. 20, 2021

    Accepted: Jan. 28, 2022

    Published Online: May. 24, 2023

    The Author Email: He Xing (hexingjiayou@126.com), Xu Bing (bing_xu_ioe@163.com)

    DOI:10.3788/LOP220640

    Topics