Acta Optica Sinica, Volume. 8, Issue 7, 631(1988)
Measurements of thin film parameters by quasi-symmetric waveguide method
A way to reduce the cut-off thicknesses of the fundamental modes in slab waveguides with prism couplers was presented. The MgO film parameters (refractive index and thickness) were measured by use of the quasi-symmetric waveguide method described in the paper, and the measurement results were given.
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WANG YUMING. Measurements of thin film parameters by quasi-symmetric waveguide method[J]. Acta Optica Sinica, 1988, 8(7): 631