Acta Optica Sinica, Volume. 18, Issue 5, 607(1998)

Measurement of the Parameters of Multi-Layer Coating by P-Polarized Reflectance

[in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    Using the P polarized reflectances, we measured the incidence angle versus the reflectance ratio γ of a three layer coating (such as “organic silicon resin SiO 2 organic silicon resin”) formed by dip coating. The optical parameters of those layers of the coating were obtained by means of data fitting. At the same time, the optical parameters of the interfaces between two coatings were investigated.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of the Parameters of Multi-Layer Coating by P-Polarized Reflectance[J]. Acta Optica Sinica, 1998, 18(5): 607

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Mar. 20, 1997

    Accepted: --

    Published Online: Oct. 18, 2006

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