Ultrafast Science, Volume. 1, Issue 1, 9848526(2021)
THz-Enhanced DC Ultrafast Electron Diffractometer
Terahertz- (THz-) based electron manipulation has recently been shown to hold tremendous promise as a technology for manipulating and driving the next generation of compact ultrafast electron sources. Here, we demonstrate an ultrafast electron diffractometer with THz-driven pulse compression. The electron bunches from a conventional DC gun are compressed by a factor of 10 and reach a duration of ~180 fs (FWHM) with 10,000 electrons/pulse at a 1 kHz repetition rate. The resulting ultrafast electron source is used in a proof-of-principle experiment to probe the photoinduced dynamics of single-crystal silicon. The THz-compressed electron beams produce high-quality diffraction patterns and enable the observation of the ultrafast structural dynamics with improved time resolution. These results validate the maturity of THz-driven ultrafast electron sources for use in precision applications.
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Dongfang Zhang, Tobias Kroh, Felix Ritzkowsky, Timm Rohwer, Moein Fakhari, Huseyin Cankaya, Anne-Laure Calendron, Nicholas H. Matlis, Franz X. Kärtner. THz-Enhanced DC Ultrafast Electron Diffractometer[J]. Ultrafast Science, 2021, 1(1): 9848526
Category: Research Articles
Received: Apr. 11, 2021
Accepted: Jun. 25, 2021
Published Online: Sep. 15, 2023
The Author Email: Kärtner Franz X. (franz.kaertner@desy.de)