Optoelectronics Letters, Volume. 15, Issue 2, 144(2019)

Multi-matrix opto-electronic system for measuring de-formation of the millimeter range radiotelescope ele-ments

Ren-pu LI1... Igor Konyakhin2, Hoa Tong Minh2 and Min ZHOU1,* |Show fewer author(s)
Author Affiliations
  • 1Chongqing Engineering Research Center of Intelligent Sensing Technology and Microsystem, Chongqing University of Post and Telecommunications, Chongqing 400065, China
  • 2Faculty of Applied Optic, ITMO University, Saint Petersburg 197101, Russia
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    A novel optical instrument is proposed and studied to measure the deformation of each connection point for a mirror, which includes 24 multi-matrix base units and can be used in millimeter-scale signal reflection systems. Experimental investigations reveal that the error of measurement is σ=8.7×10-3 mm at a distance of 5 500 mm, which allows to measure the linear deformation of a radiotelescope with the mirror diameter of 70 m.

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    LI Ren-pu, Konyakhin Igor, Tong Minh Hoa, ZHOU Min. Multi-matrix opto-electronic system for measuring de-formation of the millimeter range radiotelescope ele-ments[J]. Optoelectronics Letters, 2019, 15(2): 144

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    Paper Information

    Received: Dec. 7, 2018

    Accepted: --

    Published Online: Apr. 16, 2019

    The Author Email: Min ZHOU (1275398643@qq.com)

    DOI:10.1007/s11801-019-8191-5

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