To address motion overshoot and low imaging speed of the hopping mode inconventional scanning ion-conductance microscopy (SICM), this paper proposes a high-speed scanning method based on a dual-stage nanopositioning system. A design scheme consisting of a long-range actuator operating along with a high-speed actuator is proposed, according to the need for the SICM measurement range in the Z direction.The pipet probe can approach the sample surface with a highspeed, without contact. Rhombus-type amplification and guiding mechanism are used as the basic configuration.The key parameters of the dual-stage nanopositioner are determined by an analytical modeling. The static and dynamic characteristics of the dual-stage nanopositioner are evaluated via finite-element analysis. The final prototype is processed and overshoot and imaging experiments are performed. Experimental results show that the designed Z direction nanopositioning stage driven by the dual actuator can significantly improve the probe approach speed to at least 500 nm/ms, which effectively improves the imaging efficiency of the hopping mode, without reducing the imaging stability.