Opto-Electronic Engineering, Volume. 33, Issue 6, 37(2006)

Characters of ZrO2 films deposited by electron beam evaporation at different oxygen partial pressure

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Characters of ZrO2 films deposited by electron beam evaporation at different oxygen partial pressure[J]. Opto-Electronic Engineering, 2006, 33(6): 37

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    Received: Apr. 8, 2005

    Accepted: --

    Published Online: Nov. 14, 2007

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