Acta Optica Sinica, Volume. 41, Issue 7, 0729001(2021)

Measurement of Scattering Coefficient of Glass Subsurface Defects Based on Micron SDOCT

Changming Wang and Wanrong Gao*
Author Affiliations
  • School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing, Jiangsu 210094, China
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    A micron spectral domain optical coherence tomography (SDOCT) system built by us is used to conduct depth resolution, noncontact, and nondestructive measurement of glass subsurface defects. In addition, a single scattering model is used to calculate the obtained tomographic images, and obtain the glass scattering coefficient of glass subsurface defects. The experimental results revealed that the use of scattering coefficient is effective in distinguishing damage structures at different depths on the glass subsurface. The depth resolution measurement of the glass subsurface scattering coefficient is beneficial to the analysis of the optical characteristics of glass subsurface defects, and is essential for the processing and testing of precision optical components.

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    Changming Wang, Wanrong Gao. Measurement of Scattering Coefficient of Glass Subsurface Defects Based on Micron SDOCT[J]. Acta Optica Sinica, 2021, 41(7): 0729001

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    Paper Information

    Category: Scattering

    Received: Oct. 26, 2020

    Accepted: Nov. 24, 2020

    Published Online: Apr. 11, 2021

    The Author Email: Gao Wanrong (wgao@njust.edu.cn)

    DOI:10.3788/AOS202141.0729001

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