Acta Optica Sinica, Volume. 10, Issue 4, 313(1990)
Measurement of third order nonlinear refractive coefficients associated with the thermal effect in semiconductor-doped glasses
Both the magnitude and the sign of the third order nonlinear refractive coefficients associated with thermal effect in semiconductor-doped glass have been measured using the inte aity-dependent dispersion relation of long-range surface plasmons. Because of the sharp ATE dip of lonf-range surface plasmons, the technique developed by the authors has a good accuracy.
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of third order nonlinear refractive coefficients associated with the thermal effect in semiconductor-doped glasses[J]. Acta Optica Sinica, 1990, 10(4): 313