Chinese Optics Letters, Volume. 9, Issue 1, 011001(2011)

Point pattern matching based on kernel partial least squares

Weidong Yan1, Zheng Tian1,2, Lulu Pan1, and Jinhuan Wen1
Author Affiliations
  • 1School of Science, Northwestern Polytechnical University, Xi'an 710072, China
  • 2State Key Laboratory of Remote Sensing Science, Institute of Remote Sensing Applications, Chinese Academy of Sciences, Beijing 100101, China
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    Point pattern matching is an essential step in many image processing applications. This letter investigates the spectral approaches of point pattern matching, and presents a spectral feature matching algorithm based on kernel partial least squares (KPLS). Given the feature points of two images, we define position similarity matrices for the reference and sensed images, and extract the pattern vectors from the matrices using KPLS, which indicate the geometric distribution and the inner relationships of the feature points. Feature points matching are done using the bipartite graph matching method. Experiments conducted on both synthetic and real-world data demonstrate the robustness and invariance of the algorithm.

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    Weidong Yan, Zheng Tian, Lulu Pan, Jinhuan Wen. Point pattern matching based on kernel partial least squares[J]. Chinese Optics Letters, 2011, 9(1): 011001

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    Paper Information

    Received: Jul. 5, 2010

    Accepted: Aug. 3, 2010

    Published Online: Jan. 7, 2011

    The Author Email:

    DOI:10.3788/COL201109.011001

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