Infrared Technology, Volume. 44, Issue 2, 115(2022)

Characterization and Analysis of Interface Characteristics of InAs/GaSb Type-II Superlattice Materials

Yang REN, Gang QIN, Junbin LI, Jin YANG, Yanhui LI, Chunzhang YANG, and Jincheng KONG
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    This article systematically introduces the testing and analysis methods used by domestic and foreign research institutions to study the superlattice interface. To evaluate the quality of the superlattice interface, the InAs/GaSb type-II superlattice interface type, interface roughness, abruptness, and other characteristics can be tested and analyzed using Raman spectroscopy, high-resolution transmission electron microscopy, a scanning tunneling microscope, secondary ion mass spectroscopy, and X-ray photoelectron spectroscopy. Photoluminescence spectroscopy, high-resolution X-ray diffraction, Hall measurements, and absorption spectroscopy can be used to study the effect of the superlattice interface quality on the energy band, crystal quality, and optical properties of superlattice materials.

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    REN Yang, QIN Gang, LI Junbin, YANG Jin, LI Yanhui, YANG Chunzhang, KONG Jincheng. Characterization and Analysis of Interface Characteristics of InAs/GaSb Type-II Superlattice Materials[J]. Infrared Technology, 2022, 44(2): 115

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    Received: Oct. 19, 2020

    Accepted: --

    Published Online: Mar. 3, 2022

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