Laser & Optoelectronics Progress, Volume. 52, Issue 7, 70601(2015)
Analysis of Force to Capture Nanoparticles by Composite Laser AFM probe
Based on micro operations on nanoscale materials, a locally enhanced evanescent field theory is proposed, in which the evanescent field is produced from coupling of optical fiber probe and atomic force microscope (AFM) probe. According to the principle of near-field optics, the Fourier transform is used to deduce the evanescent field generation mechanism, and the factors affecting its strength are dicussed. In order to get the force strong enough to capture the nanoscale objects, based on the metal surface plasma resonance principle, composite optical fiber probe and AFM probe solution is used to make the propagated wave and evanescent wave converge at the conical AFM probe tip and form enhanced electromagnetic wave. The operations such as capture of nanoscale objects and movement indicate that the theory can be used in the field of microcosmic science frontier.
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Ma Lixin, Zheng Chun, Li Danting, Yang Lijun. Analysis of Force to Capture Nanoparticles by Composite Laser AFM probe[J]. Laser & Optoelectronics Progress, 2015, 52(7): 70601
Category: Fiber Optics and Optical Communications
Received: Jan. 13, 2015
Accepted: --
Published Online: Jul. 6, 2015
The Author Email: Lixin Ma (13796617159@126.com)