Chinese Journal of Quantum Electronics, Volume. 24, Issue 4, 438(2007)

Analysis of the peak profile in time-of-flight mass spectrum

Shu-dong ZHANG*... Ming-xia ZHANG, Yan WANG, Xiang-jun ZHU and Xiang-he KONG |Show fewer author(s)
Author Affiliations
  • [in Chinese]
  • show less

    A new phenomenon is observed when we use YAG 355 nm laser to ionize water/methanol mixture molecular beam and detect the ions with time-of-flight mass spectrometer. The peaks position of mass ions shift when changing the laser delay time to the molecular beam or singly changing laser energy while keeping other conditions not changed. It can be determined by analyzing mass spectra that the peak's shift does not mean new ions appear.The reason is deduced to the voltage fluctuation on the extract electrode of TOF when ions passing through the grating electrode and parts of them are being absorbed. The ion's shift altitude is proportion with the ion's intensity,and the ion's total flight time is shortened with ion's intensity increasing. The numerical simulation of charged-particle's movement in electrical field also supports the deduction and is consistent with the experimental results.

    Tools

    Get Citation

    Copy Citation Text

    ZHANG Shu-dong, ZHANG Ming-xia, WANG Yan, ZHU Xiang-jun, KONG Xiang-he. Analysis of the peak profile in time-of-flight mass spectrum[J]. Chinese Journal of Quantum Electronics, 2007, 24(4): 438

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Aug. 14, 2006

    Accepted: --

    Published Online: Jun. 7, 2010

    The Author Email: Shu-dong ZHANG (zhangsd2@126.com)

    DOI:

    CSTR:32186.14.

    Topics