Optoelectronics Letters, Volume. 10, Issue 3, 209(2014)

Effect of SiO2on the thermal stability and spectroscopic properties of Er3+-doped tellurite glasses.

Shi-chao ZHENG* and Ya-xun ZHOU
Author Affiliations
  • College of Information Science and Engineering, Ningbo University, Ningbo 315211, China
  • show less

    Er3+-doped tellurite glass (TeO2-ZnO-Na2O) prepared using the conventional melt-quenching method is modified by introducing the SiO2, and its effects on the thermal stability of glass host and the 1.53 μm band spectroscopic properties of Er3+are investigated by measuring the absorption spectra, 1.53 μm band fluorescence spectra, Raman spectra and differential scanning calorimeter (DSC) curves. It is found that for Er3++-doped tellurite glass, besides improving its thermal stability, introducing SiO2is helpful for the further improvement of the fluorescence full width at half maximum (FWHM) and bandwidth quality factor. The results indicate that the prepared Er3+-doped tellurite glass containing an appropriate amount of SiO2has good prospect as a candidate of gain medium applied for 1.53 μm broadband amplifier.

    Tools

    Get Citation

    Copy Citation Text

    ZHENG Shi-chao, ZHOU Ya-xun. Effect of SiO2on the thermal stability and spectroscopic properties of Er3+-doped tellurite glasses.[J]. Optoelectronics Letters, 2014, 10(3): 209

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Received: Feb. 9, 2014

    Accepted: --

    Published Online: Oct. 12, 2017

    The Author Email: Shi-chao ZHENG (526522025@qq.com)

    DOI:10.1007/s11801-014-4016-8

    Topics