Acta Optica Sinica, Volume. 17, Issue 7, 870(1997)
Spectrscopic Ellipsometry of Strained Si/Ge Superlattices
The dielectric functions of the strained Si M/ Ge N superlattices have been measured by using spectroscopic ellipsometer in the 2.0～5.0 eV photon energy range. The observed results were analyzed by fitting the second derivative spectrum of the dielectric function. The new superlatticelike transitions are observed in addition to the typical E1 and E2 transitions.
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[in Chinese], [in Chinese]. Spectrscopic Ellipsometry of Strained Si/Ge Superlattices[J]. Acta Optica Sinica, 1997, 17(7): 870
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