With the fast development of integrated circuits, the automotive industry, advanced manufacturing, and astronomy, fringe reflection profilometry (FRP, also called deflectometry) is widely used to measure the three-dimensional (3D) shapes of specular surfaces. FRP reconstructs the 3D shape of an object by calculating the local gradient or depth information of the specular surface using the phase information in the reflected fringe patterns. In order to gain a complete understanding of the recent developments in FRP, this paper reviews the basic principles of fringe reflection, generation of fringe patterns, phase calculation methods, calibration of system parameters, and slope integration to obtain depth data. The paper also introduces direct FRP without the integration procedure. The merits and demerits of FRP are presented through applications and examples. Finally, the future research directions of FRP are highlighted. This review paper provides a useful reference for understanding and studying the 3D surface measurements of specular reflection objects.