Laser & Optoelectronics Progress, Volume. 60, Issue 7, 0712006(2023)

High-Precision Optical Carrier Phase Measurement Technology Based on Two-Satellite Formation

Keyuan Yang, Xin Yao*, Jiamin Li, Guoyong Wang, and Zhongying Zhang
Author Affiliations
  • Institute of Space Communication and Navigation Technology, Fifth Research Institute (Xi'an) of China Aerospace Science and Technology Corporation Limited, Xi'an 710100, Shaanxi, China
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    The payload of laser ranging interferometer based on the two-satellite formation can on-orbit show numerous vital technologies in the space-based gravitational wave detection mission. In this mission, to realize the picometer-level precision in the inter-satellite displacement measurement, it is required to achieve the optical carrier phase measurement with an accuracy of better than 10-6 cycle/Hz1/2 in the mHz frequency range. The sample jitter of the phase meter's analog-to-digital converter is the bottleneck limiting the precision of the phase measurement. By applying the techniques of pilot tone and clock side-band modulation, the sampling jitter noise could be suppressed in the data post-processing algorithm. The clock side-band modulation method towards time-delay interferometry in the three-satellite formation is extended to the two-satellite formation-based dual optical carrier phase measuring system. The systematic approach is proposed to suppress the sampling jitter noise in the optical carrier phase measurement considering the inter-satellite Doppler frequency shift. The technique could be applied in the next-generation earth gravitational detection mission to on-orbit demonstrate the phase meter technology towards space-based gravitational wave detection. Furthermore, it could be used in the high-precision inter-satellite laser time and frequency transfer mission, supporting the future global navigation satellite system.

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    Keyuan Yang, Xin Yao, Jiamin Li, Guoyong Wang, Zhongying Zhang. High-Precision Optical Carrier Phase Measurement Technology Based on Two-Satellite Formation[J]. Laser & Optoelectronics Progress, 2023, 60(7): 0712006

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jan. 10, 2022

    Accepted: Mar. 30, 2022

    Published Online: May. 24, 2023

    The Author Email: Yao Xin (yaoxin_thu@163.com)

    DOI:10.3788/LOP220481

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