Laser & Optoelectronics Progress, Volume. 50, Issue 11, 112202(2013)

Effect of Material Inhomogeneity on the Image Quality of Optical Systems with Extremely Small Aberration

Yang Tianxing1、*, Huang Wei1, Shang Hongbo1, Xu Weicai1, and Zhao Feifei1,2
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  • 1[in Chinese]
  • 2[in Chinese]
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    In order to analyze the effect of optical material inhomogeneity on the image quality of optical systems with extremely small aberration, and guide the optimization of the optical systems, we propose a three-dimensional simulation and ray-tracing method. This method works in Zemax, using a self-defined program to build the three-dimension distribution of the material inhomogeneity. By setting the setp of the ray-tracing process and controlling the ray-tracing process, the simulation precision is enhanced. As an example, We study an optical system with numerical aperture (NA) of 0.7, wavelength λ=632.8 nm, wavefront aberration root-mean-square (RMS) value of 1.5 nm. The simulation result shows that the simulation precision of this three-dimensional simulation and ray-tracing method is obviously better than other two-dimensional methods.

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    Yang Tianxing, Huang Wei, Shang Hongbo, Xu Weicai, Zhao Feifei. Effect of Material Inhomogeneity on the Image Quality of Optical Systems with Extremely Small Aberration[J]. Laser & Optoelectronics Progress, 2013, 50(11): 112202

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    Paper Information

    Category: Optical Design and Fabrication

    Received: Jun. 18, 2013

    Accepted: --

    Published Online: Sep. 17, 2013

    The Author Email: Tianxing Yang (ytx123147@163.com)

    DOI:10.3788/lop50.112202

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