Infrared and Laser Engineering, Volume. 46, Issue 11, 1103003(2017)
Scanning near-field circular polarization optical microscope
A scanning near-field optical microscope (SNOM) based on an apertureless optical probe was presented. The probe had a V shape hollow on its top and coated with metal film. Illumination near-field light (NFL) will emit from the apex of probe when far-field light (FFL) is focused on the hollow. There is a phase difference between collected NFL and FFL, which relates to the distance between probe and sample. The collected FFL can be eliminated using a Glan-Taylor analyzer according to the phase difference. The experimental results show the phase difference of this system is 57°. The spatial resolution of SNCOM is less than 12 nm.
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Jin Tao, Xie Mengyu, Ji Hudong, Wu Dandan, Zheng Jihong. Scanning near-field circular polarization optical microscope[J]. Infrared and Laser Engineering, 2017, 46(11): 1103003
Category: 特约专栏-野超分辨成像技术
Received: Oct. 5, 2017
Accepted: Nov. 3, 2017
Published Online: Dec. 26, 2017
The Author Email: Tao Jin (jintao@usst.edu.cn)