Chinese Journal of Quantum Electronics, Volume. 29, Issue 2, 252(2012)

Investigation on propagation loss of silver nanowire plasmonic waveguides

Jin-bin CHEN*... Yong-hua LU, Jun TAO, Ming-fang YI, Pei WANG and Hai MING |Show fewer author(s)
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    By the far field excitation and measurement, propagation loss of wire’s surface plasmon is experimentally investigated with structure of branched-routing silver nanowire. The experimental results show that the propagation loss depends on the exciting wavelength. The coefficient of propagation loss is measured as 0.115 μm-1 at 632.8 nm and 0.0923 μm-1 at 780 nm. The propagation loss is smaller at longer wavelength, that is, SPP can propagate further at long-wavelength laser exciting. The measurement contributes to optimizing plasmonic devices based on silver nanowire waveguides.

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    CHEN Jin-bin, LU Yong-hua, TAO Jun, YI Ming-fang, WANG Pei, MING Hai. Investigation on propagation loss of silver nanowire plasmonic waveguides[J]. Chinese Journal of Quantum Electronics, 2012, 29(2): 252

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    Paper Information

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    Received: Mar. 31, 2011

    Accepted: --

    Published Online: Mar. 30, 2012

    The Author Email: Jin-bin CHEN (chenjinb@mail.ustc.edu.cn)

    DOI:10.3969/j.issn.1007-5461. 2012.02.020

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