Optics and Precision Engineering, Volume. 13, Issue z1, 5(2005)

Scattering method applied to detect the particle properties in a multiple particle field

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Scattering method applied to detect the particle properties in a multiple particle field[J]. Optics and Precision Engineering, 2005, 13(z1): 5

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    Received: Jul. 20, 2005

    Accepted: --

    Published Online: Nov. 3, 2006

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