High-efficiency normal-incidence vertical p-i-n photodetectors on a germanium-on-insulator platform: publisher’s note

Yiding Lin; Kwang Hong Lee; Shuyu Bao; Xin Guo; Hong Wang; Jurgen Michel; Chuan Seng Tan

doi:10.1364/PRJ.6.000046

Photonics Research, Volume. 6, Issue 1, 46(2018)

High-efficiency normal-incidence vertical p-i-n photodetectors on a germanium-on-insulator platform: publisher’s note

Yiding Lin^1,2,4, Kwang Hong Lee², Shuyu Bao^1,2, Xin Guo¹, Hong Wang¹, Jurgen Michel^2,3, and Chuan Seng Tan^1,2、*

Author Affiliations

¹School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore 639798, Singapore

²Low Energy Electronic Systems (LEES), Singapore-MIT Alliance for Research and Technology, Singapore 138602, Singapore

³Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA

⁴e-mail: liny0075@e.ntu.edu.sg

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This publisher’s note reports corrections to Eq. (1) in [Photon. Res.5, 702 (2017)PRHEIZ2327-912510.1364/PRJ.5.000702].

Keywords

Optoelectronics Photodetectors Photodiodes Semiconductor materials Thin film devices and applications

Equation (1) was corrected in the article ^[1] from $I_{dark} = {B T}^{1.5} e^{\frac{- E_{a}}{k T}} {\exp [q V / (e 2 k T)] - 1}$ to $I_{dark} = {B T}^{1.5} e^{\frac{- E_{a}}{k T}} (e^{\frac{q V}{2 k T}} - 1)$ The article ^[1] was corrected online as of 27 November 2017.

[1] Y. Lin, K. H. Lee, S. Bao, X. Guo, H. Wang, J. Michel, C. S. Tan. High-efficiency normal-incidence vertical p-i-n photodetectors on a germanium-on-insulator platform. Photon. Res., 5, 702-709(2017).

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Yiding Lin, Kwang Hong Lee, Shuyu Bao, Xin Guo, Hong Wang, Jurgen Michel, Chuan Seng Tan. High-efficiency normal-incidence vertical p-i-n photodetectors on a germanium-on-insulator platform: publisher’s note[J]. Photonics Research, 2018, 6(1): 46

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Paper Information

Category: Errata

Received: Nov. 28, 2017

Accepted: --

Published Online: Jul. 19, 2018

The Author Email: Chuan Seng Tan (tancs@ntu.edu.sg)

DOI:10.1364/PRJ.6.000046

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology