Journal of Synthetic Crystals, Volume. 53, Issue 12, 2124(2024)

First Principles Study on the Schottky Modulation of ZnSe/Graphene Heterojunction by External Electric Field

WEI Lai1, PANG Guowang2, ZHANG Wen1, ZHANG Lili1、*, and HUANG Yineng1,3
Author Affiliations
  • 1Xinjiang Laboratory of Phase Transitions and Microstructures in Condensed Matter Physics, College of Physical Science and Technology, Yili Normal University, Yining 835000, China
  • 2College of Science, Xinjiang Institute of Technology, Aksu 843100, China
  • 3National Laboratory of Solid State Microstructures, School of Physics, Nanjing University, Nanjing 210093, China
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    The stability of ZnSe/graphene heterojunction structure, interface interactions, interlayer charge transfer, Schottky contact type, and the influence of external electric field were studied in this paper by first principles plane wave ultra soft pseudo-potential method based on density functional theory. The results demonstrate that the heterojunction is easy to form because of its less lattice mismatch rate (below 5%), and its contact type is an n-type Schottky contact. When a positive electric field is applied, the Schottky contact type undergoes a transition from n-type to p-type. Conversely, when a negative electric field is applied, the Schottky barrier experiences a significant reduction and transforms from an n-type Schottky barrier contact to an Ohmic contact. The research results in this article will offer valuable theoretical insights for the design and fabrication of electronic optical devices, including field-effect transistors and photodetectors.

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    WEI Lai, PANG Guowang, ZHANG Wen, ZHANG Lili, HUANG Yineng. First Principles Study on the Schottky Modulation of ZnSe/Graphene Heterojunction by External Electric Field[J]. Journal of Synthetic Crystals, 2024, 53(12): 2124

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    Paper Information

    Category:

    Received: Jul. 18, 2024

    Accepted: Jan. 10, 2025

    Published Online: Jan. 10, 2025

    The Author Email: Lili ZHANG (suyi2046@sina.com)

    DOI:

    CSTR:32186.14.

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