To meet the requirements of the X-ray fluorescence spectrometer in Shanghai Synchrotron Radiation Facility(XAFS) for sensitivity and resolution， a synchrotron radiation X-ray fluorescence spectrometer was proposed based on three-crystal and multi-axis linkage. In experiments， the X-ray was provided by a double crystal monochromator， the dispersion structure was made of three concave crystals and these crystals formed an intersectant Rowland circle in the vertical plane to achieve the fluorescent analysis. Moreover， the dispersion structure could change in the Bragg angle ranges of 10°. Four-axis linkage of three crystal and two-axis linkage of the whole platform were implemented by high precisely controlling the driving device. Here， the displacement precision of each axis reaches 25 nm in a single step， which realizes high resolution and three-dimensional scanning work. The drivers software was programmed to improve the test sensitivity and resolution of the driver. The overall system software was designed by using the International Common Experimental Physical Control System-EPICS. By which， the spectrometer realizes the functions such as the precise control， automatic measurement， data analysis， results display and storage functions and completes a high precision and high resolution X-ray fluorescent spectrum analysis system based on Synchrotron Radiation Source. By taking the cobalt as the experimental sample， an analysis experiment was performed. The results show that the single measurement time is less than 1.5 s， the test precision is 0.4 eV and the resolution is 0.1 eV. The spectrometer can acquire and analyze the fluorescence of the sample and the operating time， precision， resolution and the repeatability are superior to those of the existing domestic and foreign equipment. It has been used in the scientific research experiments of Shanghai light source XAFS line.