Laser & Optoelectronics Progress, Volume. 60, Issue 2, 0222001(2023)

Scintillation Noise Test System of Image Intensifier Based on CMOS Image Sensor

Minjie Yang, Yunsheng Qian*, Yiyun Yan, and Sheng Wu
Author Affiliations
  • School of Electronic and Optical Engineering, Nanjing University of Science & Technology, Nanjing 210094, Jiangsu , China
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    With the enhancement of the performance of image intensifiers in China, flicker noise becomes one of the obstacles to further enhance resolution. To examine and study the characteristics of scintillation noise, a scintillation noise testing system is developed by selecting the image intensifier with better performance and enhancing the production process. By operating the GSENSE400BSI low-illuminance CMOS image sensor, the image on the fluorescent screen of the image intensifier was collected, and the data were transmitted using a USB interface to the computer for image analysis. In the experiment, image intensifiers were evaluated, and the corresponding dispersion coefficient distribution of scintillation noise was generated. It is discovered that the noise is the most evident in the environment with 2.8×10-6 lx illumination, and the higher the signal-to-noise ratio, the lower the overall dispersion coefficient of the image intensifier. Through the connected domain detection algorithm, under the condition of a binarization threshold of 100, the average amount of highlight noise in 200 consecutive images of three types of image intensifiers is 5.18, 1.40, 0.86, and the repeatability is 1.26%, 3.23%, 2.66%, respectively. The discrete coefficient and the amount of highlight noise can be used as one of the indicators to evaluate the display quality of image intensifier.

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    Minjie Yang, Yunsheng Qian, Yiyun Yan, Sheng Wu. Scintillation Noise Test System of Image Intensifier Based on CMOS Image Sensor[J]. Laser & Optoelectronics Progress, 2023, 60(2): 0222001

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    Paper Information

    Category: Optical Design and Fabrication

    Received: Sep. 15, 2021

    Accepted: Nov. 10, 2021

    Published Online: Jan. 6, 2023

    The Author Email: Qian Yunsheng (yshqian2015@163.com)

    DOI:10.3788/LOP212537

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