Acta Photonica Sinica, Volume. 32, Issue 7, 856(2003)
Automatically Profiling Refractive Index of a Large Sample by Using Reflection Method
Get Citation
Copy Citation Text
[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Automatically Profiling Refractive Index of a Large Sample by Using Reflection Method[J]. Acta Photonica Sinica, 2003, 32(7): 856