Acta Optica Sinica, Volume. 31, Issue 8, 834001(2011)
Simulation on Focusing Performance of X-Ray Multilayer Laue Lens for 8 keV X-Ray
A nanometer-scale focused spot of hard X-ray can be achieved by multilayer Laue lenses (MLLs). X-ray propagation in MLL is analyzed using dynamical diffraction theory. The focusing performance of tilted MLL is calculated for 8 keV X-ray. The results show that a focused beam size of 5.7 nm and a mean efficiency of 26% can be obtained by a tilted MLL with an outmost zone thickness of 5 nm. MLL is proved theoretically to be an effective method to focus X-ray beam.
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Li Haochuan, Huang Qiushi, Zhu Jingtao, Wang Zhanshan. Simulation on Focusing Performance of X-Ray Multilayer Laue Lens for 8 keV X-Ray[J]. Acta Optica Sinica, 2011, 31(8): 834001
Category: X-Ray Optics
Received: Mar. 11, 2011
Accepted: --
Published Online: Jul. 19, 2011
The Author Email: Haochuan Li (dolphin.cnc@gmail.com)