Laser & Optoelectronics Progress, Volume. 60, Issue 17, 1712006(2023)

Double-Temperature Measurements of Arc Plasmas by Integrating Two-Wavelength Moiré and Emission Tomography

Junyan Zhuang1, Yunyun Chen1,2,3、*, and Yayi Chen1,2,3
Author Affiliations
  • 1School of Physics and Optoelectronic Engineering, Nanjing University of Information Science & Technology, Nanjing 210044, Jiangsu , China
  • 2Jiangsu Key Laboratory for Optoelectronic Detection of Atmosphere and Ocean, Nanjing University of Information Science & Technology, Nanjing 210044, Jiangsu , China
  • 3Jiangsu International Joint Laboratory on Meteorological Photonics and Optoelectronic Detection, Nanjing University of Information Science & Technology, Nanjing 210044, Jiangsu , China
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    In this paper, a double-temperature refractive index model, which can be used to simultaneously obtain the temperatures of the electron and gas for plasma, is introduced. In addition, the rationality and superiority of the proposed model are theoretically discussed. Furthermore, argon arc plasmas with different injected pressures are selected as practical examples for experiments. During the experiments, refractive index measurements are performed using two-wavelength moiré tomography with probe wavelengths of 532 nm and 808 nm. The region division of the measured argon plasmas is achieved using emission tomography. Finally, the temperatures of the electron and gas are reconstructed to verify the feasibility of the double-temperature refractive index model, and the factors that might cause imprecision are analyzed. The findings of this study will be valuable for expanding the applicable region of optical computerized tomography methods and facilitating optical diagnosis in plasma flow fields .

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    Junyan Zhuang, Yunyun Chen, Yayi Chen. Double-Temperature Measurements of Arc Plasmas by Integrating Two-Wavelength Moiré and Emission Tomography[J]. Laser & Optoelectronics Progress, 2023, 60(17): 1712006

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jul. 4, 2022

    Accepted: Sep. 26, 2022

    Published Online: Aug. 29, 2023

    The Author Email: Chen Yunyun (yunqq321@sina.cn)

    DOI:10.3788/LOP221975

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