Journal of Advanced Dielectrics, Volume. 13, Issue 3, 2350009(2023)

Ferroelectric and piezoelectric properties of lead-free Li0.06(K0.5Na0.5)0.94NbO3 thin films

Xinyu Bu*... Changhong Yang*, Mengjia Fan*, Wenxuan Wang*, Xiujuan Lin* and Shifeng Huang* |Show fewer author(s)
Author Affiliations
  • Shandong Provincial Key Laboratory of Preparation and Measurement of Building Materials, University of Jinan, Jinan 250022, P. R. China
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    Lead-free (K0.5Na0.5)NbO3 (KNN) and Li0.06(K0.5Na0.5)0.94NbO3 (LKNN) thin films were fabricated by a sol-gel method. The effects of Li substitution on crystal structure, microstructure and electrical properties of KNN film were systematically studied. Li doping can enhance the ferroelectric and piezoelectric properties of KNN film. Compared with pure KNN film, the LKNN film possesses larger remanent polarization (Pr 9.3 μC/cm2) and saturated polarization (Ps 41.2 μC/cm2) and lower leakage current density (105A/cm2 at 200 kV/cm). Meanwhile, a typical butterfly shaped piezoelectric response curve is obtained in the LKNN film with a high piezoelectric coefficient (d33 105 pm/V). Excellent fatigue resistance (109 switching cycles) and aging resistance ( 180 days) demonstrate the long-term working stability of LKNN film. These findings indicate that KNN-based lead-free piezoelectric films have a broad application prospect in microelectromechanical systems (MEMS).

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    Xinyu Bu, Changhong Yang, Mengjia Fan, Wenxuan Wang, Xiujuan Lin, Shifeng Huang. Ferroelectric and piezoelectric properties of lead-free Li0.06(K0.5Na0.5)0.94NbO3 thin films[J]. Journal of Advanced Dielectrics, 2023, 13(3): 2350009

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    Paper Information

    Category: Research Articles

    Received: Oct. 13, 2022

    Accepted: Mar. 5, 2023

    Published Online: Jul. 18, 2023

    The Author Email: Bu Xinyu (mse_yangch@ujn.edu.cn), Yang Changhong (mse_yangch@ujn.edu.cn), Fan Mengjia (mse_yangch@ujn.edu.cn), Wang Wenxuan (mse_yangch@ujn.edu.cn), Lin Xiujuan (mse_yangch@ujn.edu.cn), Huang Shifeng (mse_yangch@ujn.edu.cn)

    DOI:10.1142/S2010135X23500091

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