Fast method for detecting hierarchical field contours

Opto-Electronic Engineering, Volume. 32, Issue 12, 43(2005)

[in Chinese]¹ and [in Chinese]²

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¹[in Chinese]

²[in Chinese]

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[in Chinese], [in Chinese]. Fast method for detecting hierarchical field contours[J]. Opto-Electronic Engineering, 2005, 32(12): 43

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Received: Jan. 26, 2005

Accepted: --

Published Online: Nov. 14, 2007

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