Acta Optica Sinica, Volume. 12, Issue 8, 729(1992)
A quantitative investigation of photothermal deflection spectroscopy for two-layer system
A complete theoretical treatment of photothermal deflection spectroscopy (PTDS) for two-layer system samples is given. Characteristics of the optical beam deflection signals under various conditions are discussed in consideration of the scanning microscopic imaging application of PTDS.
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[in Chinese], [in Chinese], [in Chinese]. A quantitative investigation of photothermal deflection spectroscopy for two-layer system[J]. Acta Optica Sinica, 1992, 12(8): 729
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