Laser & Optoelectronics Progress, Volume. 60, Issue 11, 1106022(2023)

A Transportable Rydberg Atomic Microwave Electrometry

Wu Bian1, Shunyuan Zheng1, Zhongqi Li1, Zhongyu Guo1, Hengkuan Ma1, Siyuan Qiu1, Kaiyu Liao1、*, Xinding Zhang1、**, and Hui Yan1,2
Author Affiliations
  • 1Guangdong Provincial Key Laboratory of Quantum Engineering and Quantum Materials, School of Physics and Telecommunication Engineering, South China Normal University, Guangzhou 510006, Guangdong, China
  • 2Guangdong-Hong Kong Joint Laboratory of Quantum Matte, Frontier Research Institute for Physics, South China Normal University, Guangzhou 510006, Guangdong, China
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    The research of the microwave electrical field measurement which is based on the Rydberg atoms is developing fast during recent years. The prerequisite for the engineering application is the minimization and integration of the microwave electrical field measurement systems. This article introduces the basic characteristics of the Rydberg atoms, the fundamental principles of the microwave electrical field measurement, and the method of determining the resonant frequency of the transition. In addition, a transportable Rydberg atomic microwave electrometry is developed by combing the 852 nm modulation transfer frequency stabilization and 509 nm electromagnetically induced transparency frequency stabilization. Based on this instrument, we demonstrate the microwave electrical field measurement which is traced back to the standard international unit systems and the detection of the weak microwave signal.

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    Wu Bian, Shunyuan Zheng, Zhongqi Li, Zhongyu Guo, Hengkuan Ma, Siyuan Qiu, Kaiyu Liao, Xinding Zhang, Hui Yan. A Transportable Rydberg Atomic Microwave Electrometry[J]. Laser & Optoelectronics Progress, 2023, 60(11): 1106022

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    Paper Information

    Category: Fiber Optics and Optical Communications

    Received: Feb. 20, 2023

    Accepted: Apr. 3, 2023

    Published Online: Jun. 7, 2023

    The Author Email: Liao Kaiyu (liaokaiyu1989@163.com), Zhang Xinding (xdzhang@scnu.edu.cn)

    DOI:10.3788/LOP230671

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