Spectroscopy and Spectral Analysis, Volume. 33, Issue 12, 3408(2013)
Determination of Film Thickness, Component and Content Based on Glass Surface by Using XRF Spectrometry
Film thickness, component and content based on glass surface were determined by using XRF technic, measure condition and instrument work condition in every layer were set and adjusted for the best measure effect for every element. Background fundamental parameter (BG-FP) method was built up. Measure results with this method were consistent with the actual preparation course and the method could fit to production application.
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MEI Yan, MA Mi-xia, NIE Zuo-ren. Determination of Film Thickness, Component and Content Based on Glass Surface by Using XRF Spectrometry[J]. Spectroscopy and Spectral Analysis, 2013, 33(12): 3408
Received: Jan. 19, 2013
Accepted: --
Published Online: Jan. 9, 2014
The Author Email: Yan MEI (meiyan@bjut.edu.cn)