Acta Photonica Sinica, Volume. 50, Issue 9, 0912002(2021)

Distortion Measurement and Correction of Projector Based on Phase Target

Yaqin SUN, Fan WANG, Jin YU, Ang ZHANG, Can ZHANG, Yuzhuo ZHANG, Nan GAO, Zhaozong MENG, and Zonghua ZHANG
Author Affiliations
  • School of Mechanical Engineering, Hebei University of Technology, Tianjin300130China
  • show less

    The traditional calibration method for calculating projector distortion is complex in system structure and theoretical derivation. Aiming at this problem, a method of measuring and correcting the distortion of the projector based on a phase target was proposed in this paper. In this method a liquid crystal display was attached with holographic projection film as a phase target. The liquid crystal display sequentially displayed the horizontal and vertical sinusoidal fringe images to obtain the unwrapping phases. The projector projected the horizontal and vertical sinusoidal fringes images to the phase target, then their unwrapping phases were calculated respectively. Using the corresponding relationship between the two sets of phase on each camera pixel, the projection phase of the projector was converted to the liquid crystal display phase coordinate system, then the distortion of the projector can be measured. The distortion was corrected according to the acquired phase space relationship, so that the isophase lines projected by the projector were linearly distributed on the phase target. Experimental results prove that the method proposed in this paper can measure and correct the distortion of the projector without the influence of camera imaging quality. It can improve the projection quality for the fringe projection three-dimensional profile measurement technology.

    Tools

    Get Citation

    Copy Citation Text

    Yaqin SUN, Fan WANG, Jin YU, Ang ZHANG, Can ZHANG, Yuzhuo ZHANG, Nan GAO, Zhaozong MENG, Zonghua ZHANG. Distortion Measurement and Correction of Projector Based on Phase Target[J]. Acta Photonica Sinica, 2021, 50(9): 0912002

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Feb. 26, 2021

    Accepted: May. 14, 2021

    Published Online: Oct. 22, 2021

    The Author Email:

    DOI:10.3788/gzxb20215009.0912002

    Topics