Chinese Journal of Lasers, Volume. 49, Issue 11, 1114001(2022)

Terahertz Radiation Enhancement from Femtosecond Laser Ionized Gas Micro-Plasma Under Static Electric Field

Yihai Wang1, Juan Long2, Chengpu Liu2、**, Tiejun Wang2,3、*, and Xin Gao1、***
Author Affiliations
  • 1College of Physics, Guizhou University, Guiyang 550025, Guizhou, China
  • 2State Key Laboratory of High Field Laser Physics and CAS Center for Excellence in Ultra-Intense Laser Science, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 3Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
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    Conclusions

    We have extended the photocurrent model on THz radiation generation from an external DC electric field biased and single-color femtosecond laser induced Ar-gas micro-plasma. The properties of THz radiation under different conditions have been analyzed. The simulation results show that the THz radiation from laser-induced plasma can be significantly enhanced by the introduction of an external DC electric field, which is linearly dependent on DC field. Furthermore, the THz polarization direction follows the direction of the external DC field. The electrons ionized and accelerated by both the laser field and the external DC electric field result in THz radiation, in which the external DC electric field has a dominant contribution. The theoretical and numerical investigations help us deeply understand the THz radiation generation process from DC electric field biased and femtosecond laser ionized gas plasma.

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    Yihai Wang, Juan Long, Chengpu Liu, Tiejun Wang, Xin Gao. Terahertz Radiation Enhancement from Femtosecond Laser Ionized Gas Micro-Plasma Under Static Electric Field[J]. Chinese Journal of Lasers, 2022, 49(11): 1114001

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    Paper Information

    Category: terahertz technology

    Received: Aug. 23, 2021

    Accepted: Nov. 8, 2021

    Published Online: Jun. 2, 2022

    The Author Email: Liu Chengpu (chpliu@siom.ac.cn), Wang Tiejun (tiejunwang@siom.ac.cn), Gao Xin (gaoxin0526@163.com)

    DOI:10.3788/CJL202249.1114001

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