Acta Optica Sinica, Volume. 10, Issue 8, 706(1990)
Optical constants of superthin films in the soft X-ray region (60-900eV)
The optical constants of superthin films have been obtained from the reflectance vs. angle of incidence measurements using synchrotron radiation in the 60-900eV soft X-ray region. Nonlinear least square curve fitting method is used for analyzing the measured data. Eesults are given for Samples of C, Au, and Pt prepared by ion-beam sputtering (IBS), and the film thickness, the rms roughness of both films and substrates are also determined.
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Optical constants of superthin films in the soft X-ray region (60-900eV)[J]. Acta Optica Sinica, 1990, 10(8): 706