Acta Optica Sinica, Volume. 31, Issue s1, 100114(2011)

Numerical Analysis of Optical Properties under Oblique Incidence of Laser in Optical Thin Films

He Minbo*, Jiang Houman, Chen Minsun, and Yuan Chun
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    Considering optical thin films irradiated by laser at oblique incidence, the electric vector is orthogonally decomposed into s-polarization and p-polarization. And based on the Maxwell equations, electromagnetic-field distribution in optical thin films is obtained. Then the optical properties of optical thin films are numerically analyzed. The results about high-reflection thin film show some features as follows. With the increase of the angle of incidence, the reflectance, transmittance and absorptivity of s-polarized light have tiny fluctuations. But for p-polarized light, obviously, the reflectance shows gradually decrease while the transmittance and absorptivity are opposite. And near the central wavelength in high-reflection thin film, both s-polarized light and p-polarized light have a high-reflectance broadband. Compared with s-polarized light, the broadband for p-polarized light is manifestly narrower and the absorptivity is relatively higher.

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    He Minbo, Jiang Houman, Chen Minsun, Yuan Chun. Numerical Analysis of Optical Properties under Oblique Incidence of Laser in Optical Thin Films[J]. Acta Optica Sinica, 2011, 31(s1): 100114

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    Paper Information

    Category: Materials

    Received: Jan. 18, 2011

    Accepted: --

    Published Online: Jun. 27, 2011

    The Author Email: Minbo He (hmb203@gmail.com)

    DOI:10.3788/aos201131.s100114

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