Spectroscopy and Spectral Analysis, Volume. 31, Issue 8, 2166(2011)

A New Spectral Similarity Measure Based on Multiple Features Integration

KONG Xiang-bing1、*, SHU Ning1, TAO Jian-bin2, and GONG Yan1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    Spectral characterization and feature selection is the key to spectral similarity measure which is the basis of both quantitative analysis and accurate object identification for hyperspectral remote sensing. However, spectral similarity measures using only one spectral feature are usually ambiguous in their distinction of similarity. Multiple spectral features integration is needed for objective spectral discrimination. We present a new spectral similarity measure, Spectral Pan-similarity Measure (SPM), based on geometric distance, correlation coefficient and relative entropy. Spectral Pan-similarity Measure objectively quantifies differences between spectra in three spectral features, the vector magnitude, spectral curve shape and spectral information content. The performance of different spectral similarity measures is compared using USGS Mineral Spectral Library and real (i.e., Operational Modular Imaging Spectrometer, OMIS) hyperspectral image. The experimental results demonstrate that the new spectral similarity measure is more effective than the spectral similarity measure taking into account only one or two features both in spectral discriminatory power and spectral identification uncertainty.

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    KONG Xiang-bing, SHU Ning, TAO Jian-bin, GONG Yan. A New Spectral Similarity Measure Based on Multiple Features Integration[J]. Spectroscopy and Spectral Analysis, 2011, 31(8): 2166

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    Paper Information

    Received: Oct. 11, 2010

    Accepted: --

    Published Online: Aug. 29, 2011

    The Author Email: Xiang-bing KONG (kongxb_whu@foxmail.com)

    DOI:10.3964/j.issn.1000-0593(2011)08-2166-05

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