Laser & Optoelectronics Progress, Volume. 47, Issue 2, 21201(2010)

Review and Trends of Image Processing Method Based on Partial Differential Equations for Electronic Speckle Pattern Interferometry

Tang Chen1,2、*, Ren Hongwei2, Chen Xia1, Cai Yuanxue3, Han Lin1, Zhang Fang1, Lu Wenjing1, Wang Wenping1, Wang Zhifang1, and Gao Tao1
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    The basic principle of image processing methods based on partial differential equations (PDE) is introduced,the variational methods used to derive PDE models are described,and the energy functional of widely used PDE denoising models is given. Our recent works of PDE-based image processing on electronic speckle pattern interferometry (ESPI) are reviewed,including performing contrast enhancement and denoising simultaneously for ESPI fringes,proposing new oriented PDE denoising models for dense ESPI fringes and a nearly preprocessing-free method for skeletonization of gray scale ESPI fringes. The main advantages of our methods are given and some suggestions are presented for the development and the research of PDE-based image processing methods on optics test technology.

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    Tang Chen, Ren Hongwei, Chen Xia, Cai Yuanxue, Han Lin, Zhang Fang, Lu Wenjing, Wang Wenping, Wang Zhifang, Gao Tao. Review and Trends of Image Processing Method Based on Partial Differential Equations for Electronic Speckle Pattern Interferometry[J]. Laser & Optoelectronics Progress, 2010, 47(2): 21201

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    Paper Information

    Category: Reviews

    Received: Jun. 15, 2009

    Accepted: --

    Published Online: Jan. 27, 2010

    The Author Email: Chen Tang (tangchen@tju.edu.cn)

    DOI:10.3788/lop47.021201

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